Characterization and acceptance testing of fully depleted thick CCDs for the Large Synoptic Survey Telescope Paper SPIE 2016

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File name:	characterization-acceptance-testing.pdf
Title:	Characterization and acceptance testing of fully depleted thick CCDs for the Large Synoptic Survey Telescope Paper SPIE 2016
Lead Author:	Ivan Kotov
Summary:	SPIE Paper June 2016 Edinburgh / Publication Board record PUB-11
Description:
Other Authors:	Justine Haupt, Paul OConnor, Thomas Smith, Peter Takacs, Homer Neal, and Jim Chiang
Publication Type:	Conference Paper
Publication Name:	SPIE Proceedings Volume
Submission Date:	Sunday, June 26, 2016 12:00:00 AM MST
Publication Date:
Keywords:	publication, spie, 2016, manuscript, camera, ccd, acceptance, characterization
Guest Access?:	No
Information Classification:	Internal
Create Date:	Friday, July 8, 2016 08:34:23 AM MST
Modified Date:	Thursday, August 18, 2016 08:53:37 PM MST
Modified By:	McKercher, Robert (User-727, mckercher:LSST)^CPX
Expiration Date:
Appears In:	SPIE 2016 - Manuscripts
Other System Impact?:	No
Max Versions:	10000
Preferred Version:	Characterization and acceptance testing of fully depleted thick CCDs for the Large Synoptic Survey Telescope Paper SPIE 2016
Handle:	Publication-110